DANGER
z Before performing test operation (b it device on/off, word device's presen
value changing, timer/counter's set value and present value changing,
buffer memory's present value changi ng) for a user-created monitor scre
or system monitoring, read the manual carefully to fully understand how
operate the equipment.
During test operation, never change the data of the devices which are u
to perform significant operation for the system.
False output or malfuncti on can cause an accident.
模块 A1SD32ID2
模块 AD35ID1
模块 A1SJ71ID2-R4
模块 A1SD32ID1
模块 AJ35PTC-CNV-GI
模拟量输出模块 A616DAI
中继模块 AJ65BT-RPI-10A
电流输入模拟量模块 Q68ADI
模块 A1SJ71ID1-R4
适配器 Q6DIN2
ID接口模块 QD35ID1
适配器 Q6DIN3
模块 AJ35PTC-CNV-SI
ID接口模块 QD35ID2
模拟输出模块 A616DAI
中断模块 AI61
外部输入/输出单元 GT15-DIOR
模拟量模块 AJ65BT-64DAI
模拟量输出模块 A1S68DAI
模拟量输出模块 Q68DAV，Q68DAI
模块 AJ71ID1-R4
适配器 Q6DIN1
模块 AJ35PTC-CNV-GI
CCLink模块 AJ65BT-64DAI
模块 AJ71ID2-R4
仿真单元 A6SIM-X64Y64
模块 A1SD35ID2
模拟量模块 AJ65VBTCU-68ADIN
中断输入模块 QI60
AS-I主站模块 FX2N-32ASI-M